ES622 Series TLP Pulsed IV-Curve System
가격 문의
An advanced IV-curve characterization system designed to simulate ESD events (TLP/ VF-TLP/ HMM/ HBM/MM pulse) and monitor a device (semiconductors, discrete, circuit modules, etc.) in high power time domain
The model ES622 Series TLP Pulsed IV-Curve System is an advanced IV-curve characterization system designed to simulate ESD events (TLP/ VF-TLP/ HMM/ HBM/MM pulse) and monitor a device (semiconductors, discrete, circuit modules, etc.) in high power time domain. The ES622 has a higher specification, more functionality, greater expansion capability and better software experience compared to the previous model ES620 and ES621.
The TLP (transmission line pulse) test function is designed to meet the latest ANSI/ESD STM5.5.1 test standard and applies high quality rectangular pulses to devices and records both the voltage across and current through the device. This gives pulsed IV curves, allowing users to characterize a device’s transient response over ns time windows. Advanced automatic device failure detection methods are incorporated, such as DC Spot Check (V or I), Static IV curve, Fuse, Breakdown, and Bias Source Fluctuation.
The VF-TLP test is designed to simulate the CDM speed ESD event and captures the voltage across the DUT and current through the DUT under a high speed (such as <100 ps rise-time) ESD transient. This allows the user to study the response speed and peak clamping voltage of a device.
The HMM (Human Metal Model) test function is an alternative test method to IEC61000-4-2 system level ESD. It gives the equivalent waveform to an ideal standard waveform for low ohm devices and eliminates many IEC gun test problems for components or wafer level tests, such as repeatability, imprecision gun tip, impedance mismatches, EMI interferences from unshielded relays and special setup with large ground plane and coupling plane etc.
Features
- Most configurable TLP Pulsed IV-Curve System
- Ultra-Compact Design System
- Fast test speed with multi-thread processing
- 20 A, 40A, 50 A, 100 A, 125A, 150 A models are available (Customization available)
- Advanced system and accessory monitor and control in software available
(switch lifespan monitor, E-Cal module, oscilloscope attenuation adjustment) - Test Function Expandable with vf-TLP, CC-TLP, HMM, HBM, MM options
- Multiple automatic failure detection methods
(DC spot check (V or I) or IV sweep, fuse, breakdown, and bias current change) - Software controlled pulsing: Burst, Continuous, IV-Curve Characterization
- Rise-Time options from 40 ps to 1200 ns *(depends on model, customization available)
- Pulse-Width options from 1 ns to 2000 ns *(depends on model, customization available)
Note*: Longer pulse applications are supported by EOS series with pulse width from few hundred of ns to few ms.
Applications
- ESD performance characterization
- Wafer/ package level ESD test
- System / circuit module ESD test
- Safe operation area (SOA) test
- Charge recovery time test
- Solar panel diode characterization
- Touchscreen ITO trace fuse and breakdown test
Related Standards:
- TLP / VF-TLP option meets ANSI/ESD STM 5.5.1
- HMM option meets ANSI/ESD SP5.6
- HBM option meets ANSI/ESDA/JEDEC JS-001
- MM option meets ANSI/ESDA SP5.2
Specifications
우체국택배
반품 배송비(편도)2,500원
교환 배송비(왕복)5,000원
반품/교환 주소지(18478) 경기도 화성시 동탄역로 160 롯데백화점 동탄점 B3, 120호(KAIST-화성시 사이언스 허브 KAIST 동탄캠퍼스)
반품/교환 신청 기준일상품 수령 후 7일 이내 (단, 제품이 표시광고 내용과 다르거나 불량 등 계약과 다르게 이행된 경우는 제품 수령일로부터 3개월이내나 그 사실을 안 날 또는 알 수 있었던 날부터 30일 이내 교환/반품이 가능)
반품/교환 불가능 사유1. 소비자의 잘못으로 물건이 멸실되거나 훼손된 경우(단, 내용물을 확인하기 위해 포장을 훼손한 경우는 제외)
2. 소비자가 사용해서 물건의 가치가 뚜렷하게 떨어진 경우
3. 시간이 지나 다시 판매하기 곤란할 정도로 물건의 가치가 뚜렷하게 떨어진 경우
4. 복제가 가능한 물건의 포장을 훼손한 경우 (CD, DVD, GAME, 도서 등)
5. 용역 또는 문화산업진흥 기본법 제2조제5호의 디지털콘텐츠의 제공이 게시된 경우 (단, 가분적 용역 또는 가분적 디지털콘텐츠로 구성된 계약의 경우 제공이 개시되지 않은 부분은 제외)
6. 소비자의 주문에 따라 개별적으로 생산되는 상품이 제작에 들어간 경우